"A Test Structure to Analyze Highly-Doped-Drain and Lightly-Doped-Drain in ..."

Takashi Ohzone et al. (2006)

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DOI: 10.1093/IETELE/E89-C.9.1351

access: closed

type: Journal Article

metadata version: 2020-04-11

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Takashi Ohzone, Kazuhiko Okada, Takayuki Morishita, Kiyotaka Komoku, Toshihiro Matsuda, Hideyuki Iwata:
A Test Structure to Analyze Highly-Doped-Drain and Lightly-Doped-Drain in CMOSFET. IEICE Trans. Electron. 89-C(9): 1351-1357 (2006)

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