"A Fault Signature Characterization Based Analog Circuit Testing Scheme and ..."

Wimol San-Um, Masayoshi Tachibana (2010)

> Home

Details and statistics

DOI: 10.1587/TRANSINF.E93.D.33

access: closed

type: Journal Article

metadata version: 2020-04-11

- view
  authority control:
- export record
  dblp key:
  - journals/ieicet/San-UmT10
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/ieicet/San-UmT10
Wimol San-Um, Masayoshi Tachibana:
A Fault Signature Characterization Based Analog Circuit Testing Scheme and the Extension of IEEE 1149.4 Standard. IEICE Trans. Inf. Syst. 93-D(1): 33-42 (2010)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.