"A New LDMOS Transistor Macro-Modeling for Accurately Predicting Bias ..."

Takashi Sato et al. (2010)

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DOI: 10.1587/TRANSFUN.E93.A.1605

access: closed

type: Journal Article

metadata version: 2024-06-17

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Takashi Sato, Toshiki Kanamoto, Saiko Kobayashi, Nobuhiko Goto, Takao Sato, Hitoshi Sugihara, Hiroo Masuda:
A New LDMOS Transistor Macro-Modeling for Accurately Predicting Bias Dependence of Gate-Overlap Capacitance. IEICE Trans. Fundam. Electron. Commun. Comput. Sci. 93-A(9): 1605-1611 (2010)

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