default search action
"A New LDMOS Transistor Macro-Modeling for Accurately Predicting Bias ..."
Takashi Sato et al. (2010)
- Takashi Sato, Toshiki Kanamoto, Saiko Kobayashi, Nobuhiko Goto, Takao Sato, Hitoshi Sugihara, Hiroo Masuda:
A New LDMOS Transistor Macro-Modeling for Accurately Predicting Bias Dependence of Gate-Overlap Capacitance. IEICE Trans. Fundam. Electron. Commun. Comput. Sci. 93-A(9): 1605-1611 (2010)
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.