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"FG Width Scalability of the 3-D Vertical FG NAND Using the Sidewall ..."

Moon-Sik Seo, Tetsuo Endoh (2012)

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DOI: 10.1587/TRANSELE.E95.C.891

access: closed

type: Journal Article

metadata version: 2020-04-11

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  dblp key:
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  persistent URL:
  - https://dblp.org/rec/journals/ieicet/SeoE12
Moon-Sik Seo, Tetsuo Endoh:
FG Width Scalability of the 3-D Vertical FG NAND Using the Sidewall Control Gate (SCG). IEICE Trans. Electron. 95-C(5): 891-897 (2012)

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