"Comparative Study on Top- and Bottom-Source Vertical-Channel Tunnel ..."

Min-Chul Sun et al. (2012)

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DOI: 10.1587/TRANSELE.E95.C.826

access: closed

type: Journal Article

metadata version: 2025-03-10

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  - https://dblp.org/rec/journals/ieicet/SunKKKKP12
Min-Chul Sun, Hyun Woo Kim, Sang Wan Kim, Garam Kim, Hyungjin Kim, Byung-Gook Park:
Comparative Study on Top- and Bottom-Source Vertical-Channel Tunnel Field-Effect Transistors. IEICE Trans. Electron. 95-C(5): 826-830 (2012)

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