"Back- and Front-Interface Trap Densities Evaluation and Stress Effect of ..."

Kenichi Takatori, Hideki Asada, Setsuo Kaneko (2008)

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DOI: 10.1093/IETELE/E91-C.10.1564

access: closed

type: Journal Article

metadata version: 2020-04-11

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Kenichi Takatori, Hideki Asada, Setsuo Kaneko:
Back- and Front-Interface Trap Densities Evaluation and Stress Effect of Poly-Si TFT. IEICE Trans. Electron. 91-C(10): 1564-1569 (2008)

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