"One-Shot Voltage-Measurement Circuit Utilizing Process Variation."

Takumi Uezono, Takashi Sato, Kazuya Masu (2009)

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DOI: 10.1587/TRANSFUN.E92.A.1024

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type: Journal Article

metadata version: 2024-06-17

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Takumi Uezono, Takashi Sato, Kazuya Masu:
One-Shot Voltage-Measurement Circuit Utilizing Process Variation. IEICE Trans. Fundam. Electron. Commun. Comput. Sci. 92-A(4): 1024-1030 (2009)

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