"Layout-Aware Compact Model of MOSFET Characteristics Variations Induced by ..."

Kenta Yamada et al. (2008)

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DOI: 10.1093/IETELE/E91-C.7.1142

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type: Journal Article

metadata version: 2024-06-17

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Kenta Yamada, Takashi Sato, Shuhei Amakawa, Noriaki Nakayama, Kazuya Masu, Shigetaka Kumashiro:
Layout-Aware Compact Model of MOSFET Characteristics Variations Induced by STI Stress. IEICE Trans. Electron. 91-C(7): 1142-1150 (2008)

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