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"A Novel Per-Test Fault Diagnosis Method Based on the Extended ..."
Yuta Yamato et al. (2008)
- Yuta Yamato, Yusuke Nakamura, Kohei Miyase, Xiaoqing Wen, Seiji Kajihara:
A Novel Per-Test Fault Diagnosis Method Based on the Extended X-Fault Model for Deep-Submicron LSI Circuits. IEICE Trans. Inf. Syst. 91-D(3): 667-674 (2008)
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