"Hybrid Test Application in Partial Skewed-Load Scan Design."

Yuki Yoshikawa et al. (2011)

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DOI: 10.1587/TRANSFUN.E94.A.2571

access: closed

type: Journal Article

metadata version: 2020-04-11

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Yuki Yoshikawa, Tomomi Nuwa, Hideyuki Ichihara, Tomoo Inoue:
Hybrid Test Application in Partial Skewed-Load Scan Design. IEICE Trans. Fundam. Electron. Commun. Comput. Sci. 94-A(12): 2571-2578 (2011)

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