"Scan Shift Time Reduction Using Test Compaction for On-Chip Delay Measurement."

Wenpo Zhang, Kazuteru Namba, Hideo Ito (2014)

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DOI: 10.1587/TRANSINF.E97.D.533

access: closed

type: Journal Article

metadata version: 2020-04-11

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Wenpo Zhang, Kazuteru Namba, Hideo Ito:
Scan Shift Time Reduction Using Test Compaction for On-Chip Delay Measurement. IEICE Trans. Inf. Syst. 97-D(3): 533-540 (2014)

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