"Improving Small-Delay Fault Coverage of On-Chip Delay Measurement by ..."

Wenpo Zhang, Kazuteru Namba, Hideo Ito (2014)

> Home

Details and statistics

DOI: 10.1587/TRANSINF.2014EDP7110

access: closed

type: Journal Article

metadata version: 2020-04-11

- view
  authority control:
- export record
  dblp key:
  - journals/ieicet/ZhangNI14a
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/ieicet/ZhangNI14a
Wenpo Zhang, Kazuteru Namba, Hideo Ito:
Improving Small-Delay Fault Coverage of On-Chip Delay Measurement by Segmented Scan and Test Point Insertion. IEICE Trans. Inf. Syst. 97-D(10): 2719-2729 (2014)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.