"Formulation of a Test Pattern Measure That Counts Distinguished ..."

Tsutomu Inamoto, Yoshinobu Higami (2020)

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DOI: 10.1587/TRANSFUN.2020VLP0007

access: closed

type: Journal Article

metadata version: 2021-01-18

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Tsutomu Inamoto, Yoshinobu Higami:
Formulation of a Test Pattern Measure That Counts Distinguished Fault-Pairs for Circuit Fault Diagnosis. IEICE Trans. Fundam. Electron. Commun. Comput. Sci. 103-A(12): 1456-1463 (2020)

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