"Statistical Gate-Delay Modeling with Intra-Gate Variability."

Kenichi Okada, Kento Yamaoka, Hidetoshi Onodera (2003)

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type: Journal Article

metadata version: 2021-06-08

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Kenichi Okada, Kento Yamaoka, Hidetoshi Onodera:
Statistical Gate-Delay Modeling with Intra-Gate Variability. IEICE Trans. Fundam. Electron. Commun. Comput. Sci. 86-A(12): 2914-2922 (2003)

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