"Built-in-self-test technique for diagnosis of delay faults in ..."

Nachiketa Das, Pranab Roy, Hafizur Rahaman (2013)

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DOI: 10.1049/IET-CDT.2012.0111

access: closed

type: Journal Article

metadata version: 2020-07-14

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Nachiketa Das, Pranab Roy, Hafizur Rahaman:
Built-in-self-test technique for diagnosis of delay faults in cluster-based field programmable gate arrays. IET Comput. Digit. Tech. 7(5): 210-220 (2013)

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