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"Efficient testing and diagnosis of faulty power switches in SOCs."

Sandeep Kumar Goel, Maurice Meijer, José Pineda de Gyvez (2007)

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DOI: 10.1049/IET-CDT:20060147

access: closed

type: Journal Article

metadata version: 2020-07-14

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  - https://dblp.org/rec/journals/iet-cdt/GoelMG07
Sandeep Kumar Goel, Maurice Meijer, José Pineda de Gyvez:
Efficient testing and diagnosis of faulty power switches in SOCs. IET Comput. Digit. Tech. 1(3): 230-236 (2007)

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