"Low-overhead single-event upset hardened latch using programmable ..."

X. She, N. Li (2010)

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DOI: 10.1049/IET-CDT.2009.0026

access: closed

type: Journal Article

metadata version: 2020-07-14

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X. She, N. Li:
Low-overhead single-event upset hardened latch using programmable resistance cells. IET Comput. Digit. Tech. 4(5): 420-427 (2010)

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