"Fault tolerance and reliability in field-programmable gate arrays."

Edward A. Stott, N. Pete Sedcole, Peter Y. K. Cheung (2010)

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DOI: 10.1049/IET-CDT.2009.0011

access: closed

type: Journal Article

metadata version: 2020-07-14

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Edward A. Stott, N. Pete Sedcole, Peter Y. K. Cheung:
Fault tolerance and reliability in field-programmable gate arrays. IET Comput. Digit. Tech. 4(3): 196-210 (2010)

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