"Scan cell design for launch-on-shift delay tests with slow scan enable."

Gefu Xu, Adit D. Singh (2007)

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DOI: 10.1049/IET-CDT:20060142

access: closed

type: Journal Article

metadata version: 2020-07-14

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Gefu Xu, Adit D. Singh:
Scan cell design for launch-on-shift delay tests with slow scan enable. IET Comput. Digit. Tech. 1(3): 213-219 (2007)

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