"Fast and automatic security test on cryptographic ICs against fault ..."

Cuiping Shao, Huiyun Li, Jianbin Zhou (2017)

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DOI: 10.1049/IET-IFS.2016.0203

access: closed

type: Journal Article

metadata version: 2020-08-27

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Cuiping Shao, Huiyun Li, Jianbin Zhou:
Fast and automatic security test on cryptographic ICs against fault injection attacks based on design for security test. IET Inf. Secur. 11(6): 312-318 (2017)

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