"Software defect prediction based on stacked sparse denoising autoencoders ..."

Nana Zhang et al. (2022)

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DOI: 10.1049/SFW2.12029

access: open

type: Journal Article

metadata version: 2023-04-04

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  - https://dblp.org/rec/journals/iet-sen/ZhangY0Z22
Nana Zhang, Shi Ying, Kun Zhu, Dandan Zhu:
Software defect prediction based on stacked sparse denoising autoencoders and enhanced extreme learning machine. IET Softw. 16(1): 29-47 (2022)

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