"Double-ended travelling-wave fault location based on residual analysis ..."

Yanhui Xi et al. (2018)

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DOI: 10.1049/IET-SPR.2017.0486

access: closed

type: Journal Article

metadata version: 2025-01-19

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Yanhui Xi, Xiaodong Zhang, Zewen Li, Xiangjun Zeng, Xin Tang, Yonglin Cui, Hui Xiao:
Double-ended travelling-wave fault location based on residual analysis using an adaptive EKF. IET Signal Process. 12(8): 1000-1008 (2018)

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