"Deep Learning-Based Integrated Circuit Surface Defect Detection: ..."

Xiaobin Wang et al. (2024)

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DOI: 10.1007/S44196-024-00423-W

access: open

type: Journal Article

metadata version: 2024-03-08

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Xiaobin Wang, Shuang Gao, Jianlan Guo, Chu Wang, Liping Xiong, Yuntao Zou:
Deep Learning-Based Integrated Circuit Surface Defect Detection: Addressing Information Density Imbalance for Industrial Application. Int. J. Comput. Intell. Syst. 17(1): 29 (2024)

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