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"A capacitance-ratio quantification design for linearity test in ..."

An-Sheng Chao et al. (2015)

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DOI: 10.1002/CTA.2014

access: closed

type: Journal Article

metadata version: 2020-05-11

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An-Sheng Chao, Cheng-Wu Lin, Hsin-Wen Ting, Soon-Jyh Chang:
A capacitance-ratio quantification design for linearity test in differential top-plate sampling sar ADCS. Int. J. Circuit Theory Appl. 43(10): 1333-1350 (2015)

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