"Reliability Evaluation of MMC-MTDC System Considering Device Failure Rates ..."

Kang Li et al. (2025)

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DOI: 10.1002/CTA.4274

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type: Journal Article

metadata version: 2025-09-11

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Kang Li, Xiaoming Zha, Meng Huang, Rongjun Chen, Zhimin Lu:
Reliability Evaluation of MMC-MTDC System Considering Device Failure Rates and Multi-State Transition. Int. J. Circuit Theory Appl. 53(6): 3402-3413 (2025)

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