"Process-induced variability modeling of subthreshold leakage power ..."

Anala M. Reddy, B. P. Harish (2020)

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DOI: 10.1002/CTA.2755

access: closed

type: Journal Article

metadata version: 2020-05-22

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Anala M. Reddy, B. P. Harish:
Process-induced variability modeling of subthreshold leakage power considering device stacking. Int. J. Circuit Theory Appl. 48(5): 739-749 (2020)

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