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"Sensing margin trend with technology scaling in MRAM."
Jee-Hwan Song et al. (2011)
- Jee-Hwan Song, Jisu Kim, Seung-Hyuk Kang, Sei-Seung Yoon, Seong-Ook Jung:
Sensing margin trend with technology scaling in MRAM. Int. J. Circuit Theory Appl. 39(3): 313-325 (2011)
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