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"The feature generator of hard negative samples for fine-grained image ..."

Taehung Kim, Kibeom Hong, Hyeran Byun (2021)

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DOI: 10.1016/J.NEUCOM.2020.10.032

access: closed

type: Journal Article

metadata version: 2021-05-05

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Taehung Kim, Kibeom Hong, Hyeran Byun:
The feature generator of hard negative samples for fine-grained image recognition. Neurocomputing 439: 374-382 (2021)

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