Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Sub-Pixel Level Defect Detection Based on Notch Filter and Image Registration."

Longyuan Guo et al. (2018)

> Home

Details and statistics

DOI: 10.1142/S0218001418540162

access: closed

type: Journal Article

metadata version: 2022-11-07

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/ijprai/GuoLHWTHOZ18
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/ijprai/GuoLHWTHOZ18
Longyuan Guo, Shinan Li, Wenjing Hu, Jianhui Wu, Bing Tu, Wei He, Xianfeng Ou, Guoyun Zhang:
Sub-Pixel Level Defect Detection Based on Notch Filter and Image Registration. Int. J. Pattern Recognit. Artif. Intell. 32(6): 1854016:1-1854016:15 (2018)

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.