"The Application of HIWO-SVM in Analog Circuit Fault Diagnosis."

Hongzhi Hu et al. (2015)

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DOI: 10.1142/S0218001415500196

access: closed

type: Journal Article

metadata version: 2020-05-11

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  - https://dblp.org/rec/journals/ijprai/HuTGO15a
Hongzhi Hu, Shulin Tian, Qing Guo, Aijia Ouyang:
The Application of HIWO-SVM in Analog Circuit Fault Diagnosis. Int. J. Pattern Recognit. Artif. Intell. 29(8): 1550019:1-1550019:27 (2015)

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