"Modeling Patent Quality: A System for Large-scale Patentability Analysis ..."

Shohei Hido et al. (2012)

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DOI: 10.11185/IMT.7.1180

access: closed

type: Journal Article

metadata version: 2024-08-31

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Shohei Hido, Shoko Suzuki, Risa Nishiyama, Takashi Imamichi, Rikiya Takahashi, Tetsuya Nasukawa, Tsuyoshi Idé, Yusuke Kanehira, Rinju Yohda, Takeshi Ueno, Akira Tajima, Toshiya Watanabe:
Modeling Patent Quality: A System for Large-scale Patentability Analysis using Text Mining. Inf. Media Technol. 7(3): 1180-1191 (2012)

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