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"Special issue on Mutation Testing."

Mike Papadakis, René Just (2017)

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DOI: 10.1016/J.INFSOF.2016.08.003

access: closed

type: Journal Article

metadata version: 2022-08-16

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  - https://dblp.org/rec/journals/infsof/PapadakisJ17
Mike Papadakis, René Just:
Special issue on Mutation Testing. Inf. Softw. Technol. 81: 1-2 (2017)

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