"Boosting mutation-based fault localization by effectively generating ..."

Shumei Wu et al. (2025)

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DOI: 10.1016/J.INFSOF.2024.107660

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type: Journal Article

metadata version: 2025-02-14

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Shumei Wu, Binbin Yang, Zexing Chang, Zheng Li, Xiang Chen, Yong Liu:
Boosting mutation-based fault localization by effectively generating Higher-Order Mutants. Inf. Softw. Technol. 180: 107660 (2025)

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