"Fast electromigration stress analysis using Low-Rank Balanced Truncation ..."

Olympia Axelou et al. (2023)

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DOI: 10.1016/J.VLSI.2022.12.005

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type: Journal Article

metadata version: 2025-08-05

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Olympia Axelou, George Floros, Nestor E. Evmorfopoulos, George I. Stamoulis:
Fast electromigration stress analysis using Low-Rank Balanced Truncation for general interconnect and power grid structures. Integr. 89: 197-206 (2023)

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