"Why current secure scan designs fail and how to fix them?"

Aijiao Cui et al. (2017)

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DOI: 10.1016/J.VLSI.2016.10.011

access: closed

type: Journal Article

metadata version: 2025-10-14

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Aijiao Cui, Yanhui Luo, Huawei Li, Gang Qu:
Why current secure scan designs fail and how to fix them? Integr. 56: 105-114 (2017)

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