"Concurrent built-in self-testing under the constraint of shared test ..."

Szu Huat Goh et al. (2017)

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DOI: 10.1016/J.VLSI.2017.06.006

access: closed

type: Journal Article

metadata version: 2023-03-28

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Szu Huat Goh, Y. H. Chan, Zhao Lin, Jeffrey Lam:
Concurrent built-in self-testing under the constraint of shared test resources and its test time reduction. Integr. 59: 198-205 (2017)

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