"Characterizing SRAM and FF soft error rates with measurement and simulation."

Masanori Hashimoto et al. (2019)

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DOI: 10.1016/J.VLSI.2019.03.005

access: closed

type: Journal Article

metadata version: 2025-01-19

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Masanori Hashimoto, Kazutoshi Kobayashi, Jun Furuta, Shin-ichiro Abe, Yukinobu Watanabe:
Characterizing SRAM and FF soft error rates with measurement and simulation. Integr. 69: 161-179 (2019)

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