"Efficient high dimensional yield analysis for SRAM circuits via stack ..."

Kaijie Li et al. (2025)

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DOI: 10.1016/J.VLSI.2025.102477

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type: Journal Article

metadata version: 2025-10-13

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Kaijie Li, Liang Pang, Xudong Zhang, Yutao Miao, Yushi Zhang:
Efficient high dimensional yield analysis for SRAM circuits via stack model and adaptive sampling. Integr. 104: 102477 (2025)

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