"Grammar-based fuzz testing for microprocessor RTL design."

Dan Luo et al. (2022)

> Home

Details and statistics

DOI: 10.1016/J.VLSI.2022.05.001

access: closed

type: Journal Article

metadata version: 2022-08-25

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/integration/LuoLCZS22
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/integration/LuoLCZS22
Dan Luo, Tun Li, Liqian Chen, Hongji Zou, Mingchuan Shi:
Grammar-based fuzz testing for microprocessor RTL design. Integr. 86: 64-73 (2022)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.