"A current monitoring technique for IDDQ testing in digital ..."

Sotirios Matakias et al. (2015)

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DOI: 10.1016/J.VLSI.2015.01.005

access: closed

type: Journal Article

metadata version: 2024-10-06

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Sotirios Matakias, Yiorgos Tsiatouhas, Angela Arapoyanni, Themistoklis Haniotakis:
A current monitoring technique for I_DDQ testing in digital integrated circuits. Integr. 50: 48-60 (2015)

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