"Test and diagnosis pattern generation for distinguishing stuck-at faults ..."

Navya Mohan, J. P. Anita (2022)

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DOI: 10.1016/J.VLSI.2021.12.002

access: closed

type: Journal Article

metadata version: 2022-02-23

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Navya Mohan, J. P. Anita:
Test and diagnosis pattern generation for distinguishing stuck-at faults and bridging faults. Integr. 83: 24-32 (2022)

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