"Lifetime improvement by exploiting aggressive voltage scaling during ..."

Farzaneh Nakhaee et al. (2018)

> Home

Details and statistics

DOI: 10.1016/J.VLSI.2017.10.013

access: closed

type: Journal Article

metadata version: 2020-10-26

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/integration/NakhaeeKAPFD18
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/integration/NakhaeeKAPFD18
Farzaneh Nakhaee, Mehdi Kamal, Ali Afzali-Kusha, Massoud Pedram, Sied Mehdi Fakhraie, Hamed Dorosti:
Lifetime improvement by exploiting aggressive voltage scaling during runtime of error-resilient applications. Integr. 61: 29-38 (2018)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.