"Full-chip wire-oriented back-end-of-line TDDB hotspot detection and ..."

Shaoyi Peng et al. (2020)

> Home

Details and statistics

DOI: 10.1016/J.VLSI.2019.09.012

access: closed

type: Journal Article

metadata version: 2020-02-20

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/integration/PengDST20
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/integration/PengDST20
Shaoyi Peng, Ertugrul Demircan, Mehul D. Shroff, Sheldon X.-D. Tan:
Full-chip wire-oriented back-end-of-line TDDB hotspot detection and lifetime analysis. Integr. 70: 90-98 (2020)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.