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"A gate-delay model focusing on current fluctuation over wide range of ..."

Kenichi Shinkai, Masanori Hashimoto, Takao Onoye (2013)

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DOI: 10.1016/J.VLSI.2013.01.003

access: closed

type: Journal Article

metadata version: 2022-01-03

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Kenichi Shinkai, Masanori Hashimoto, Takao Onoye:
A gate-delay model focusing on current fluctuation over wide range of process-voltage-temperature variations. Integr. 46(4): 345-358 (2013)

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