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"A gate-delay model focusing on current fluctuation over wide range of ..."
Kenichi Shinkai, Masanori Hashimoto, Takao Onoye (2013)
- Kenichi Shinkai, Masanori Hashimoto
, Takao Onoye:
A gate-delay model focusing on current fluctuation over wide range of process-voltage-temperature variations. Integr. 46(4): 345-358 (2013)
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