"Valid test pattern identification for VLSI adaptive test."

Tai Song et al. (2022)

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DOI: 10.1016/J.VLSI.2021.08.009

access: closed

type: Journal Article

metadata version: 2021-12-25

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Tai Song, Tianming Ni, Zhengfeng Huang, Jinlei Wan:
Valid test pattern identification for VLSI adaptive test. Integr. 82: 1-6 (2022)

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