


default search action
"A simple built-in current sensor for IDDQ testing of CMOS data converters."
- Ashok K. Srivastava, Srinivas Rao Aluri, Anand Kumar Chamakura:

A simple built-in current sensor for IDDQ testing of CMOS data converters. Integr. 38(4): 579-596 (2005)

manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.


Google
Google Scholar
Semantic Scholar
Internet Archive Scholar
CiteSeerX
ORCID













