"Variability in nanometer CMOS: Impact, analysis, and minimization."

Dennis Sylvester, Kanak Agarwal, Saumil Shah (2008)

> Home

Details and statistics

DOI: 10.1016/J.VLSI.2007.09.001

access: closed

type: Journal Article

metadata version: 2024-06-04

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/integration/SylvesterAS08
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/integration/SylvesterAS08
Dennis Sylvester, Kanak Agarwal, Saumil Shah:
Variability in nanometer CMOS: Impact, analysis, and minimization. Integr. 41(3): 319-339 (2008)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.