"Robust power grid network design considering EM aging effects for ..."

Han Zhou, Liang Chen, Sheldon X.-D. Tan (2021)

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DOI: 10.1016/J.VLSI.2020.10.001

access: closed

type: Journal Article

metadata version: 2024-02-28

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Han Zhou, Liang Chen, Sheldon X.-D. Tan:
Robust power grid network design considering EM aging effects for multi-segment wires. Integr. 77: 38-47 (2021)

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