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"Complete test-set generation for bridging faults in combinational-logic ..."

Sanjoy Kumar Basu, Jogesh Chandra Paul, Pramode Ranjan Bhattacharjee (1986)

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DOI: 10.1016/0020-0255(86)90025-3

access: closed

type: Journal Article

metadata version: 2017-05-27

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Sanjoy Kumar Basu, Jogesh Chandra Paul, Pramode Ranjan Bhattacharjee:
Complete test-set generation for bridging faults in combinational-logic circuits. Inf. Sci. 38(3): 257-269 (1986)

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