"A Built-in Self-Test Circuitry Based on Reconfiguration for Analog and ..."

Sergey G. Mosin (2011)

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DOI: 10.5755/J01.ITC.40.3.635

access: open

type: Journal Article

metadata version: 2021-02-16

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Sergey G. Mosin:
A Built-in Self-Test Circuitry Based on Reconfiguration for Analog and Mixed-Signal IC. Inf. Technol. Control. 40(3): 260-264 (2011)

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